List of Instruments:

> XRF
> Berch XRF
> Drying Oven
> Balanced
> Sieved Shaker
> Sets of Sieves
> Distance Meter

The analytical sieve shakers of the series AS 200 are used in research & development,

quality control of raw materials, interim and finished products as well as in production monitoring.

The controllable electromagnetic drive offers an optimal adaption for every product. 

Sharp fractions are obtained even after very short sieving times.

With its advanced sensors

Can quickly capture extensive scene data

Scan range up to 300m

Scan rate up to 640,000 pts/s

With 1-inch CMOS detachable panoramic camera

Imagery resolution can be 6528×3264

Allows you to experience the power of multiple high-precision mapping methods

including SLAM, PPK-SLAM, and RTK-SLAM

Swiftly acquire point cloud data with absolute coordinates